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minal input voltage EUT’s can be performed.
10.3 Test Revision
The MIL-ST
A selection
D 704 option is capable of performing many sub-sections of MIL-STD 704 revision D or E.
is made available to specify the revision of standard to be applied to the EUT. The MIL704
option defaults to Revision E.
California Instruments 128
User Manual Compact i/iX Series
10.4 Available MIL-STD 704 Tests
10.4.1 STEADY STATE
AC Mode:
1. Steady State Voltage and Frequency test
2. Waveform Distortion test
3. Voltage Modulation test
8. Transient Voltage low and high test
9. Transient Frequency low and high test
DC Mode:
1. Steady State Voltage test
2. Ripple test (limit frequency range).
4. Voltage Unbalance test
5. Phase Unbalance test
6. Frequency Modulation test
7. Voltage Modulation test
10.4.2 EMERGENCY STATE
AC Mode:
1. Emergency Voltage minimum and maximum test
2. Emergency Frequency minimum and maximum test
10.4.3 ABN R
DC Mode:
1. Emergency Voltage minimum and maximum test
O MAL STATE
AC d
2. age over
2. Abnormal Voltage over
Mo e:
1. Abnormal Voltage under
Abnormal Volt
3. Abnormal Frequency under
4. Abnormal Frequency under
DC Mode:
1. Abnormal Voltage under
California Instruments 129
User Manual Compact i/iX Series
10.5 Front Panel Operation MIL704
To perform a test from the keyboard, from the MENU 2 screen, select the APPLICATIONS screen.
The APPLICATIONS screen will appear as shown in Figure 10-1.
Figure 10-1: Applications Menu
Scroll to the MIL-STD-704 entry using the up and down cursor keys. Press the ENTER key to select
the MIL704 main menu. One of the screens will appear as shown in.
Note: The user has to turn on the Output relay before starting a test and set the steady state setup for
the test. NOM FREQ must be set to match the desired steady state frequency. All MIL704 revisions
will accept 400Hz as a nominal frequency. Revision F only will accept 60Hz and VFREQ.
Figure 10-2: MIL704 Menu
10.5.1 Revision Selection
The default Revision is E. Revisions supported is D, E and F. The Revision can be changed from the
front panel. Scroll to the REVISION entry using the up and down cursor keys (Figure 10-2). Use the
shu
10.5.2 Nominal Frequency Selection
ttle to change the selection.
Three selections are available for the nominal frequency to be used:
tion is active in all revisions. Program frequency must be set to 400Hz.
• 60Hz, this selection is active for revision F only. Program frequency must be set to 60Hz to
run the tests.
Note that the programmed frequency of the AC source must be the same as the selected nominal test
frequenc e 704 scree etting Conflict ill be generated when
attemptin . T only b ged from the normal setup
screen. Select the nom cy pplication screen does not change the output
frequency programmed.
• 400Hz, this selec
• VFREQ, this selection is active for revision F only. Program frequency must be set between
360Hz and 800Hz to run the tests.
y selected in th
g to ru a test
n. If not, a S
fre
error w
n he programmed e c an
inal t equen
quency can
in t 04 A
h
ing est fr he 7
California Instruments 130
User Manual Compact i/iX Series
10.6 AC Test Mode
Following sections cover testing in AC output mode.
10.6.1 Steady State Tests
Scroll to the STEADY STATE entry using the up and down cursor keys. Press the ENTER key to
select the STEADY STATE screens. The screen will appear as shown in Figure 10-3
enu
ady state screens have the following tests:
NCE
CE
N
The above tests can be selected by scrolling to the highlighted selection using the up and down cursor
keys and the ENTER key to start the selected test.
Figure 10-3: Steady State M
The MIL704 Ste
1. VOLTAGE
2. FREQUENCY
3. VOLT UNBALA
4. PHASE DIFFEREN
5. VOLT MODULATIO
6. FREQ MODULATION
7. VOLT TRANSIENT
8. FREQ TRANSIENT
9. DISTORTION
VOLTAGE
This test will change the output voltage in the sequence shown in Table 10-1.
SEQUENCE VOLTAGE TIME
400Hz/VFREQ 60Hz only
1 108 110 1 minute
2 118 125 1 minute
3 115 115 1 minute
Table 10-1: Steady state voltage
The ← key (backspace) will terminate the test at any time.
California Instruments 131
User Manual Compact i/iX Series
FREQUENCY
This test will change the output frequency in the sequence shown in Table 10-2.
SEQUENCE FREQUENCY TIME
400Hz VFREQ 60 Hz
　
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