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TARPS N/A
CONTINUOUS
COMMANDED MONITOR COCKPIT
20. 2. N/A
53. 2. N/A
63. 2. N/A
63. 2. N/A
03. 2. 03.
110. 30. 110.
3. N/A N/A
3. 2. N/A
4. 2. N/A
2. 10. N/A
20. 2. N/A
40. 5. N/A
40. 5. N/A
15. N/A (Note 2)
(Note 3) 1. N/A
N/A 2. N/A
N/A 2. N/A
3. 2. N/A
2. N/A N/A
2. 2. N/A
55. Mins 1. N/A
30. 2. N/A
15. 12. N/A
12. 10. N/A
12. 10. N/A
2. N/A N/A
2. N/A N/A
150. 2. N/A
3. N/A (Note 4)
N/A 2. N/A
N/A 2. N/A
N/A 1. (Note 5)
5. 5. N/A
6. 2. N/A
10. 1. N/A
(Note 6) (Note 6) (Note 6)
N/A 2. N/A
Figure 38-4. Subsystem BIT Mode Test Times (Sheet I of 2)
ORIGINAL 38-6
NAVAIR 01.F14AAD-1
CONTINUOUS
SUBSYSTEM/DESIGNATION INITIAL COMMANDED MONITOR COCKPIT
Notes:
1. All test times are in seconds unless other&e noted.
2. This test is the Data Link BAD (D/L BAD) test initiated by the RIO or Pilot. This test remains in effect for as
long as the MASTER TEST panel switch is in D/L BAD. Refer to Operator Initiated BIT section for more
information.
3. DSS Commanded BIT times of 5.0 and 65.0 seconds correspond to the Data Storage Set (DSS) test, and
the DSS test including the Bulk Memory Checksum test, respectively.
4. This test remains in effect for as long as the PUSH TO TEST knob on the RADAR ALTITUDE indicator is
held depressed.
5. This test remains in effect for as long as the TEST switch on the RADAR WARNING RCVFI panel is held to
BIT. Once released, the test completes in approximately 13 seconds.
3. JTIDS initial BIT will cause a 4-second loss of tacan lock. Atacan self-test is performed during JTIDS
OBC. See Chapter 20 for additional details.
Figure 384. Subsystem BIT. Mode Test Ties (Sheet 2 of 2)
Current failure information is also displayed on the
TlD in the OBCCM window (refer to paragraph 38.5),
and on the MFDs in the warning/caution/advisory
window for certain equipment failures.
38.3.1 Built-In-Test Description. Several types
ofBITaresupportedbyeachsubsystemandareperformed
internally.T hesem odesi nclude:p ower-up( or initial), pe
riodic (continwus or automatic), and commanded (includes
both MFD and cockpit control panel initiated) BIT.
Refer to Figure 38-4 for approximateB IT times for each
subsystemR. egardlesso f the BIT type, detectedf ailures
arer etainedf or the affecteds ubsystemb y the MCS. Each
modeofBITcontainsaseriesofteststhatdifferticmmode
to mode.B ecauseo f thesed ifferences,a priority for each
subsystemd eterminesw hena subsystemfa ilure no longer
exists.O thert estsp erformedb y the MCS included ata-bus
channetl ests,a nd a test to determinet he compatibility of
eachs ubsystem’s& ware load with the MCS OFR
38.3.1.1 BIT Modes. The following is a brief description
of each BIT mode. Refer to Figure 384 for
subsystem applicability.
Initial BIT is performed by each subsystem upon the
application of electrical power. This mode of BIT is only
performeda fterp owerh asb eeno ff for a specific lengtho f
time (i.e., cold start) and then m&red. For shorter power
intenuptions(i .e.,w arm start),th is mode of BlT is not performed
The MCS monitome achs ubsystemfo r a response
(GO or NO GO) at the completion of this mode.
Continwus-monitor BIT is performed by each subsystem
on s continwus and noninterfeting basis (i.e., subsystem
continues to perform normal operational mode as
well). The BIT time is usually 2 secondsT. he MCS monitors
eachs ubsystema t a l-secondr atei n ordert o establish
current status (GO or NO GO).
Commanded BIT is performed by each subsystem
when commanded through the MFDs or by a cockpit
control panel (when available). This mode is typically
the most comprehensivea ndp rovidest he highest degree
of fault isolation. When used, this mode interrupts normal
operation of the selected subsystem. The MCS
monitors the subsystem while it is in test and the response
(GO or NO GO) at the completion of test.
Data bus test is performed by the MCS in order to
detect data bus (mission bus No. 1 and No. 2, and intercomputer
bus) channel failures. Computer bus channel
failures are detected and reported by the RDP to the
MCS. Each channel is tested on MCS cold start, and
when a subsystem fmt responds on the data bus. The
test consists of transmitting several test patterns of data
across each channel to a subsystem, and then reading
back the data. A disagreement in the data establishes a
NO GO for the data bus channel at fault. Since most
bussed subsystems are dual redundant on the data bus,
　
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