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1 393 360 59 1 minute
2 407 800 61 1 minute
3 400 SSF 60 1 minute
Table 10-2: Steady state frequency
VOLT UNB A
This test will change the output voltage for t
The test will be repeated on three phase systems to include all three phases if the coupling is set to all.
The key (backspace) will termi
PHASE DIF R
te.
VOLTAGE MODULATION
This test will vary the output voltage by ±2.5V rms over a period of one second. The test will last for 2
min s space) will terminate the test at any time.
FREQUENCY MODULATION
The ← key (backspace) will terminate the test at any time.
AL NCE
he selected phase only in the following sequence:
• 112V for 1 minute.
• 118V for 1 minute.
• 115V for 1 minute.
← nate the test at any time.
FE ENCE
This test applies to three phase systems only. The phase angle for the selected phase will change
relative to phase A in the following sequence:
If phase B is selected:
• 236° for 1 minute.
• 244° for 1 minute.
• 240° for 1 minu
If phase C is selected:
• 116° for 1 minute.
• 124° for 1 minute.
• 120° for 1 minute
ute . The ← key (back
REVISION D E F (400Hz /VFREQ) F (60HZ)
MODULATION ±7Hz ±4Hz ±4Hz ±0.5Hz
Table 10-3: Frequency Modulation
Table 10-3 over a period of one minute. The test
will last for 4 minutes. The ← key (backspace) will terminate the test at any time.
This test will vary the output frequency as defined by
California Instruments 132
User Manual Compact i/iX Series
WAVEFORM DISTORTION
This test will generate a 5% THD voltage distortion on the output voltage waveform. Using a clipped
sine wave causes the distortion. The test will last for 2 minutes. The ← key (backspace) will terminate
the test
HIGH VOLTAGE TRANSIENT
the selected phase in the following sequence:
•
For 60 Hz only:
o 120V in 83.3msec.
• Stay at 120V for 75msec.
Note: Prior to the test, a voltage range change may take place if the power source is set for the low
voltage range. This will cause the EUT to loose power momentarily. If this is not acceptable, the power
source must be left in high range at all times.
e, a 5 second delay will be inserted at the nominal test voltage. The ← key (backspace)
will terminate the test at any time.
LOW VOLT E
This test will change the output voltage for the selected phase only in the following sequence:
• 80V for 10msec.
• Linearly increase to108V in 70msec.
• Stay at 108V for 95msec before returning to 115V.
For 60Hz only:
• 0V for 1.67msec.
• Linearly increase to 70V in 14msec.
• Linearly increase to 105V in 83.3msec
• Stay at 105V for 75msec.
After this sequence, a 5 second delay will be inserted at the nominal test voltage. The ← key (backspace)
will terminate the test at any time.
HIGH FREQUENCY TRANSIENT
This test will change the output frequency in the following sequence:
For 400Hz and VFREQ:
• 425Hz for 1 sec.
at any time.
This test will change the output voltage for
For 400 Hz and VFREQ:
• 180V for 10msec.
Linearly reduced to118V in 78msec.
• Stay at 118V for 87msec before returning to 115V.
• 170V for 1.67msec
• Linearly reduced to 130V in 14msec.
• Linearly reduced t
After this sequenc
AG TRANSIENT
For 400 Hz and VFREQ:
California Instruments 133
User Manual Compact i/iX Series
• 420Hz for 4 sec.
• 410Hz for 5 sec.
• 61Hz for 0.5 sec.
• 60.5Hz for 0.5 sec.
After this sequence, a 5 second de inal test f equency. The ← key
(backspace) will terminate the test
LOW FREQUENCY TRANSIENT
This test will change the output frequency in the following sequence:
• 380Hz for 4 sec.
• 390Hz for 5 sec.
• 393Hz for 4 sec.
After this sequence, a 5 second delay will be inserted at the nominal test frequency. The ← key
(backspace) will terminate the test at any time.
• 407Hz for 4 sec.
For 60Hz only:
lay will be inserted at the nom
at any time.
r
For 400Hz and VFREQ:
• 375Hz for 1 sec.
For 60Hz only:
• 59Hz for 0.5 sec.
• 59.5Hz for 0.5 sec.
California Instruments 134
User Manual Compact i/iX Series
10.6.2 Emergency Test
From the MIL704 main menu (Figure 10-2) scroll to the EMERGENCY entry using the up and down
cursor keys. Press the ENTER key to select the EMERGENCY screens. The screen will appear as
　
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